ACP300 Current Probe
ACP300 High-Precision AC/DC Current Probe
The ACP300 AC/DC Current Probe is built for precision detection of small and medium currents. It combines a precise ±300A measuring range, DC–50MHz frequency coverage, ≤7ns rise time and an industrial-grade durable design, delivering stable and reliable current measurement for power electronics R&D, consumer electronics debugging and laboratory precision testing.
Covers board-level, branch, bridge-arm and medium-power current measurement scenarios.
Provides strong waveform reproduction for high-frequency pulse and fast switching analysis.
Helps capture switching edges, ringing and high-frequency transient behavior.
Typical precision measurement, with ±3% warranty value for engineering validation.
Small Range, High Performance, Ideal for Precision Testing
The ACP300 is positioned as a high-performance current probe for small-current and medium-current precision testing. Its value lies in combining compact structure, high bandwidth, high precision and industrial durability, making it suitable for SiC R&D, power supply R&D, board-level current testing and university or research-institute laboratories.
Designed for R&D Scenarios Where Waveform Fidelity Matters
With highly stable sensor technology, ACP300 achieves ±1% typical measurement precision and minimum sensitivity down to 0.02A in the low range. It is designed to help engineers capture tiny current changes, reproduce fast current waveforms and maintain confidence in sophisticated testing tasks.
High Bandwidth, Small-Current Sensitivity and Flexible Range Switching
The ACP300 restores the document’s core product value: accurate measurement, wide frequency response, flexible range adaptation and simple operation for precision current detection across multiple R&D and laboratory environments.
Reliable Measurement Data
Typical accuracy reaches ±1%, while the warranty value is ±3%, supporting dependable current measurement for demanding engineering validation.
DC–50MHz Coverage
Accurately measures DC signals and efficiently captures high-frequency pulse waveforms, covering testing from low-frequency debugging to high-frequency analysis.
30A / 300A Dual Ranges
Low and high maximum-current ranges support both small-current precision debugging and medium-power current measurement.
0.02A / 0.2A Minimum Sensitivity
Enables engineers to observe tiny current fluctuations that may be critical in refined circuit design and troubleshooting.
Dual Power Supply, Automatic Setup and Plug-and-Play Testing
The ACP300 follows the ACP series convenience design. It supports oscilloscope direct power supply and USB-Type C power supply, eliminating the need for a dedicated external adapter and reducing setup complexity for both bench and independent test use.
Oscilloscope Direct Power Supply
When paired with a compatible oscilloscope, the probe can be directly powered by the oscilloscope interface, reducing external wiring and adapter dependency.
USB-Type C Power Supply
The probe can also be powered through USB-Type C, enabling independent or flexible use across laboratory and field testing situations.
Automatic Attenuation Setting
The attenuation ratio can be automatically identified and set after connection, depending on oscilloscope support, reducing manual configuration errors.
Power-on Measurement Workflow
No complex debugging or manual calibration is required after connection; engineers can start current measurement after power-on.
Compact Probe Head for Board-Level and Confined-Space Measurement
The ACP300 uses a compact probe-head structure with 5mm maximum wire-diameter support, making it convenient for board-level current measurement, branch-current testing and confined-space troubleshooting. A 2m cable provides practical connection flexibility across bench and field setups.
Stable Operation Across Harsh and Long-Duration Test Conditions
The ACP300 is not limited to clean bench environments. Its industrial-grade structure, wide operating-temperature range, rugged sensor and environmental adaptability are designed to support reliable current testing in both R&D laboratories and industrial-site conditions.
-40℃ to +85℃ Operating Range
The whole unit supports a wide temperature range, expanding use beyond traditional high-frequency current probe limitations.
High-Dust and High-Vibration Use
The product is designed for industrial-site reliability, including high-dust and high-vibration environments.
Highly Stable Sensor
The sensor structure is described as stable and damage-resistant, helping reduce frequent maintenance and equipment wear costs.
Long-Term Maximum Current Test
The probe supports long-duration maximum-current testing, and maximum-current frequency derating is not required.
Low Insertion Impedance
Extremely low insertion impedance helps prevent sensor overheating and supports stable long-hour operation.
Customization Potential
For special high-bandwidth and high-current scenarios, the product can be customized according to user requirements.
Built for Precision Electronic R&D, Laboratories and Power Electronics
The ACP300 primarily serves precision current testing in consumer electronics, small industrial equipment, laboratories and medium-power power electronics. It is particularly suitable where waveform reproduction, compact jaws and small-current sensitivity are more important than extreme current capacity.
Precision Electronic R&D
Circuit R&D and debugging for consumer electronics and small industrial equipment, including tiny current fluctuation capture.
Laboratory Testing
Electronic experiment teaching and scientific research project measurement in universities and research institutions.
Equipment Maintenance
Fault diagnosis and performance testing of small power equipment and electronic instruments.
NEV Electric Drive Inverters
IGBT/SiC bridge-arm current, switching losses, Miller plateau and ringing analysis.
OBC, DC/DC and On-board Power
LLC resonant current, PFC inductor current and high-frequency ripple testing.
Industrial / Server Power / UPS
Power circuit and branch current measurement with high bandwidth and moderate current range.
University Power Electronics Labs
High-performance waveform reproduction for advanced power electronics experiments and research projects.
EMI / EMC Interference Location
High-frequency interference tracing and waveform observation in debugging and compliance preparation.
Connector, Power and Attenuation Setup Made Simpler
Compared with conventional current probes that require a dedicated external power adapter and manual attenuation setting, the ACP series reduces wiring complexity and streamlines measurement setup across compatible oscilloscope platforms.
1st–3rd Generation Interface Compatibility
The replaceable adapter design supports oscilloscope interfaces from the 1st generation to the 3rd generation, providing broad platform coverage for engineering teams.
Exclusive Patented Connector Design
The connector enables oscilloscope direct power supply and supports automatic attenuation-ratio configuration on compatible oscilloscopes.
Adapter Replacement Protects Investment
When switching to a different oscilloscope platform, only a simple adapter replacement is needed for compatibility, helping maximize the value of existing instruments.
Less Wiring, Faster Setup
Direct power and automatic attenuation configuration reduce external adapter burden and simplify the measurement setup procedure.
Complete ACP300 Specification Matrix
This matrix restores the full parameter set from the ACP300High document, including current range, bandwidth, attenuation, sensitivity, environmental durability, power supply, derating and physical probe-head dimensions.
| Parameter | ACP300 Value | Engineering Meaning |
|---|---|---|
| Maximum Current | ±300A | Medium current range for board-level, branch and precision scenarios. |
| Bandwidth | DC–50MHz | High bandwidth for waveform reproduction and high-frequency pulse capture. |
| Rise Time | ≤7ns | Supports observation of fast transient behavior and switching details. |
| Accuracy | ±1% typical value; ±3% warranty value | Precision measurement for demanding R&D and validation. |
| Low / High Maximum Current | 30A / 300A | Two ranges for small-current and medium-current testing. |
| Attenuation Ratio | 20X / 200X | Automatic setting depending on oscilloscope support. |
| Minimum Sensitivity | 0.02A / 0.2A | Captures tiny current changes in precision R&D. |
| Maximum Wire Diameter | 5mm | Suitable for common wires and compact board-level layouts. |
| Maximum Bare Wire Voltage | 150V RMS CAT II; 100V RMS CAT III | Safety category reference from the product document. |
| Power Requirements | Oscilloscope direct supply / USB-Type C supply | Dual power supply without a dedicated external adapter. |
| Attenuation Ratio Setting | Automatic, depending on oscilloscope | Reduces manual setup and configuration error. |
| Long-Term Maximum Current Test | Yes | Supports sustained maximum-current testing. |
| Maximum Current Frequency Derating | No | Maintains testing capability without frequency derating. |
| Sensor | Highly stable, damage-resistant | Rugged sensor structure for long-term use. |
| Operating Temperature Range | -40℃ to +85℃ | Supports harsh environments and extended operating conditions. |
| High-Dust Environment Use | Yes | Suitable for industrial-site testing. |
| High-Vibration Environment Use | Yes | Suitable for rugged equipment environments. |
| Cable Length | 2m | Practical bench and field connection length. |
| Probe Head Length | 17.5cm | Physical planning dimension. |
| Probe Head Width | 1.8cm | Compact width for confined spaces. |
| Probe Head Height | 4cm | Physical planning dimension. |
How to Select a Current Probe for Precision and High-Frequency Testing
Current probe selection should balance bandwidth, current rating, measurement accuracy, jaw opening diameter and operating environment. The ACP300 is most suitable when engineers need high bandwidth, moderate current capacity, compact jaw size and strong waveform reproduction.
Use 3–5× Signal Frequency
Probe bandwidth should generally be 3 to 5 times the maximum frequency of the measured signal so waveform distortion remains controlled.
Probe and Oscilloscope Work Together
The overall system bandwidth is determined by the lower bandwidth between the probe and oscilloscope, so both sides must be considered together.
Probe ≥80% of Scope Bandwidth
It is recommended that probe bandwidth reaches at least 80% of oscilloscope bandwidth; for example, a 500MHz oscilloscope needs at least a 400MHz probe.
Cover Peak Current With Margin
The current range should cover the peak current of the measured signal with 20%–30% margin to avoid overload and preserve measurement reliability.
Avoid Excess Bandwidth for Low-Frequency Tests
For low-frequency tests, unnecessary bandwidth may introduce RF noise; engineers should select bandwidth based on actual signal requirements.
Prioritize Flatness and Resonance Control
For high-frequency testing, choose probes with frequency flatness within ±1dB and resonance peaks outside the operating frequency band.