AC/DC Current Probe for Power Electronics Lab and EMC Testing
Capture current waveforms in power electronics R&D, SiC development, switching power supplies and EMC troubleshooting with high-bandwidth ACP current probes.
Power electronics labs need current probes that can show waveform details, not only current magnitude. Engineers often move between boards, converters, modules and test benches, so setup speed and durability matter.
Challenges in Power Electronics R&D Labs
Power electronics labs need current probes that can show waveform details, not only current magnitude. Engineers often move between boards, converters, modules and test benches, so setup speed and durability matter.
Fast Switching Edges
Fast switching edges in SiC, GaN and IGBT circuits challenge probe bandwidth.
Ripple & Ringing
Current ripple, ringing and transient events that require sufficient bandwidth.
Multiple Test Points
Multiple test points around OBC, DC/DC, inverter and power supply boards.
Slow Setup
External power adapters and manual probe setup slowing down daily testing.
Fragile Sensors
Fragile high-frequency sensors that are easy to damage in active lab use.
EMC Source Localization
Difficulty identifying noise sources around high-frequency current paths.
How ACP Probes Help
ACP series probes are designed for oscilloscope-based AC/DC current waveform measurement. Their clamp-style design allows non-invasive testing, while oscilloscope direct power supply helps simplify the bench setup.
High-Frequency Capture
Capturing high-frequency current waveforms up to DC–50MHz with ACP300.
Broad Coverage
Measuring current in power supplies, inverters, converters and motor drives.
Auto Attenuation
Supporting automatic attenuation configuration depending on oscilloscope compatibility.
Reduced Wiring
Reducing bench wiring through oscilloscope direct supply and USB Type-C supply.
Lab Durable
Providing a durable sensor structure for frequent lab use.
EMC Troubleshooting
Helping engineers observe high-frequency current paths during EMC troubleshooting.
Why Bandwidth Matters for Lab & EMC Testing
The probe bandwidth should generally be 3 to 5 times the highest frequency component that needs to be observed. For fast switching circuits, ACP300 with DC–50MHz is often the first model to evaluate.
Choose the Right Lab Probe
ACP300 should be the default model for lab waveform analysis and EMC-related troubleshooting. ACP1000 is better when the current range exceeds ACP300 requirements.
Typical Test Scenarios
- SiC MOSFET and IGBT switching current waveform capture
- LLC resonant converter current measurement
- PFC inductor current analysis
- OBC and DC/DC converter current ripple testing
- Server power supply, UPS and industrial power supply debugging
- EMC noise source localization around high-frequency current paths
- Motor drive and inverter bridge arm current testing
Parameters and Advantages
| Capability | ACP Series Advantage |
|---|---|
| Bandwidth | Up to DC–50MHz with ACP300 |
| Current range | ±300A for ACP300; ±1000A for ACP1000 |
| Rise time | ACP300 ≤7ns; ACP1000 ≤8.5ns based on internal product data |
| Accuracy | ±1% typical value, ±3% warranty value |
| Power supply | Oscilloscope direct supply or USB Type-C supply |
| Attenuation setup | Automatic, depending on oscilloscope compatibility |
| Operating temperature | −40°C to +85°C |
| Durability | Stable sensor structure for frequent lab handling |
Frequently Asked Questions
Which ACP model is best for power electronics labs?
ACP300 is recommended for most lab waveform analysis because it provides DC–50MHz bandwidth and ±300A range. ACP1000 is recommended when higher current range is required.
Can ACP probes help with EMC troubleshooting?
Yes. ACP probes can help engineers observe high-frequency current paths, ripple and switching-related current behavior during EMC troubleshooting.
Can ACP probes be powered by an oscilloscope?
Yes. ACP probes support oscilloscope direct power supply and USB Type-C power supply, helping reduce bench wiring.
How should I choose current probe bandwidth?
The probe bandwidth should generally be 3 to 5 times the highest frequency component that needs to be observed. For fast switching circuits, ACP300 is often the first model to evaluate.
Are customized probes available for R&D labs?
Yes. Current range, bandwidth, jaw size, cable length and interface configuration can be customized for special R&D benches.
Ready to Equip Your Lab?
Contact VASO today to find the right ACP current probe for your power electronics R&D or EMC testing bench. Fast setup, reliable waveform capture, lab-durable design.